This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignee: Abb Schweiz Ag. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Taisuke Minagawa and Robot-Cycle Outlier Detection.
Introduction
Taisuke Minagawa is an inventor associated with Barcelona, Spain, and Abb Schweiz AG. His patent work addresses the analysis of robot-cycle data to identify unusual patterns in industrial processes.
Latest Patents
Minagawa is credited with 1 patent: “Outlier Detection Based on Process Fingerprints from Robot Cycle Data.” The invention describes a system that collects cyclic data, with each vector representing an individual robot cycle, and stores that data for processing. A cycle-start signal triggers cloud processing, which parses the stored data according to metadata defined in a configuration file. The system then uses that metadata to extract process fingerprints and detect outliers.
Career Highlights
Minagawa’s listed patent reflects work at the intersection of robotics, industrial data collection, and cloud-based analytics. By organizing robot-cycle measurements into process fingerprints, the disclosed approach provides a structured basis for identifying deviations in cycle data.
Collaborations
The supplied information names Benjamin Kloepper and Arzam Muzaffar Kotriwala as Minagawa’s coworkers. Their inclusion indicates professional connections associated with his work, though specific roles in the patent are not provided.
Conclusion
Taisuke Minagawa’s patent focuses on using metadata-driven process fingerprints to detect outliers in robot-cycle data, highlighting an application of cloud analytics to industrial robotics.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile