Santa Clara, China

TaiPing Zhou

This inventor holds 1 USPTO granted patent. Top assignee: Hon Hai Precision Industry Co., Ltd.. Active years: 2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: TaiPing Zhou. Retrieved from https://idiyas.com/inventor/taiping-zhou

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: The Innovations of TaiPing Zhou

Introduction

TaiPing Zhou is a notable inventor based in Santa Clara, China. He has made significant contributions to the field of engineering, particularly with his innovative designs and inventions. His work has garnered attention in the industry, showcasing his expertise and creativity.

Latest Patents

TaiPing Zhou holds a patent for a testing machine. This invention reflects his commitment to advancing technology and improving testing methodologies in various applications. The patent demonstrates his ability to identify needs in the market and develop solutions that address those needs.

Career Highlights

Zhou is currently employed at Hon Hai Precision Industry Co., Ltd., a leading technology company known for its manufacturing and innovation. His role at the company allows him to work on cutting-edge projects and collaborate with other talented professionals in the field.

Collaborations

Some of his coworkers include Chun Nan Ou and Galei Hu. Their collaboration fosters a creative environment that encourages the exchange of ideas and the development of innovative solutions.

Conclusion

TaiPing Zhou's contributions to the field of engineering and his innovative spirit exemplify the qualities of a successful inventor. His work continues to inspire others in the industry, and his patent for the testing machine is a testament to his ingenuity.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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