Odawara, Japan

Taiichiro Miwa

This inventor holds 1 USPTO granted patent. Top assignee: Kasei Optonix, Ltd.. Active years: 2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Taiichiro Miwa. Retrieved from https://idiyas.com/inventor/taiichiro-miwa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: The Innovations of Taiichiro Miwa

Introduction

Taiichiro Miwa is a notable inventor based in Odawara, Japan. He has made significant contributions to the field of phosphor technology, particularly through his innovative patent. His work is recognized for its potential applications in various analytical techniques.

Latest Patents

Taiichiro Miwa holds a patent for a phosphor consisting of hollow particles. This invention includes phosphor slurry and phosphor beads designed for analysis using tracer techniques. The unique aspect of his patent is the hollow particles, each featuring an outer shell with an internal space, which enhances their functionality in various applications.

Career Highlights

Miwa is associated with Kasei Optonix, Ltd., where he continues to develop and refine his inventions. His expertise in phosphor technology has positioned him as a key figure in his field. With a focus on innovation, he has contributed to advancements that may influence future technologies.

Collaborations

One of his notable collaborators is Naoto Kijima. Their partnership has fostered a creative environment that encourages the development of new ideas and technologies.

Conclusion

Taiichiro Miwa's contributions to phosphor technology exemplify the spirit of innovation. His work not only showcases his inventive capabilities but also highlights the importance of collaboration in advancing technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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