Company Filing History:
Years Active: 2015
Title: The Innovative Mind of Taigo Nakajima: A Pioneer in Substrate Inspection Technology
Introduction: Taigo Nakajima is a prominent inventor based in Kyoto, Japan, known for his groundbreaking advancements in substrate inspection technology. With a unique perspective and a deep understanding of the industry, Nakajima has developed unique solutions that address critical challenges in the field.
Latest Patents: Taigo Nakajima holds a significant patent for a "Substrate Inspection Apparatus and Substrate Inspection Method." This innovative apparatus is designed to detect the conditions of an edge bead removal (EBR) line at a substrate's edge, enhancing the precision with which substrate inspection can be performed. The system comprises a turntable that rotates a substrate with a coated film, alongside a light irradiator and a photoelectric converter that captures and analyzes the specularly reflected light from the substrate. By generating a two-dimensional image through the detection values of electrical signals from a radial scan, Nakajima's invention facilitates the identification of changing points using a judgment band along the directional analysis of the two-dimensional image.
Career Highlights: Taigo Nakajima's career is marked by his role at Screen Holdings Co., Ltd., a leading company in the field of imaging and inspection technologies. His contributions have been influential in propelling the company's innovations forward, especially in the realm of semiconductor manufacturing and substrate inspection.
Collaborations: Throughout his career, Nakajima has collaborated with notable colleagues, including Kunio Ueta and Kazutaka Taniguchi. Together, they have shared insights and expertise that have fostered a culture of innovation within their team, further advancing the technologies developed at Screen Holdings Co., Ltd.
Conclusion: Taigo Nakajima's work exemplifies the spirit of innovation and dedication to advancing technology in substrate inspection. With a patented solution that offers significant improvements in inspection accuracy and efficiency, he stands as a noteworthy figure in the industry. His collaborations and contributions continue to make an impact, setting new standards in substrate inspection technology.