Frankfort, IL, United States of America

Tai M Liang

This inventor holds 2 USPTO granted patents. Top assignee: The Sherwin Williams Company. Active years: 2002-2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tai M Liang. Retrieved from https://idiyas.com/inventor/tai-m-liang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 2

Forward Citations = 20(Granted Patents)


Company Filing History:


Years Active: 2002-2004

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2 patents (USPTO):Explore Patents

Title: The Innovations of Tai M Liang

Introduction

Tai M Liang is a notable inventor based in Frankfort, Illinois. He has made significant contributions to the field of coatings, holding a total of 2 patents. His work focuses on radiation curable coatings, which have applications in various industries.

Latest Patents

Among his latest patents, Tai M Liang has developed a radiation curable coating having low gloss and coated articles made therefrom. This innovation is aimed at enhancing the performance and aesthetic qualities of coated surfaces. His work in this area demonstrates a commitment to advancing coating technologies.

Career Highlights

Tai M Liang is currently employed at The Sherwin-Williams Company, a leading provider of paints and coatings. His role at the company allows him to apply his expertise in developing innovative coating solutions. His contributions have been instrumental in the company's ongoing success in the coatings industry.

Collaborations

Throughout his career, Tai has collaborated with talented individuals such as William R Dawson and Joseph E Miller. These partnerships have fostered a creative environment that encourages innovation and the development of new ideas.

Conclusion

Tai M Liang's work exemplifies the spirit of innovation in the coatings industry. His patents and collaborations highlight his dedication to advancing technology and improving product performance.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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