Tahsin M Kurc

Title: Innovations of Tahsin M Kurc

Introduction

Tahsin M Kurc is an accomplished inventor based in Coram, NY (US). He holds a total of 3 patents that showcase his expertise in image data analysis and impedance-sensitive systems. His work has significantly contributed to advancements in these fields.

Latest Patents

One of his latest patents is a system and method associated with predicting segmentation quality of objects in the analysis of copious image data. This innovative system receives a collection of image data, segments it based on associated objects, and determines the quality of segmentation for respective classifications. It generates a training dataset to train a classification model, which is then used to predict segmentation quality in test images.

Another notable patent involves a method of testing an impedance-sensitive system with a switching device. This method includes switching a disconnecting device to permit energy transmission, implementing measurements, and verifying the results against target specifications. The process aims to display correct functions or malfunctions based on the verification.

Career Highlights

Tahsin M Kurc has worked with prestigious institutions such as the State University of New York and the University of Texas System. His experience in these organizations has allowed him to develop and refine his innovative ideas.

Collaborations

Throughout his career, he has collaborated with notable individuals, including Joel Haskin Saltz and Tianhao Zhao. These collaborations have further enriched his work and contributed to his success as an inventor.

Conclusion

Tahsin M Kurc's contributions to the fields of image data analysis and impedance-sensitive systems are noteworthy. His innovative patents and collaborations reflect his commitment to advancing technology and improving methodologies in these areas.