San Jose, CA, United States of America

Taejin Chun

This inventor holds 1 USPTO granted patent. Top assignee: Panasonic Intellectual Property Corporation of America. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Taejin Chun. Retrieved from https://idiyas.com/inventor/taejin-chun-f2x08k4p

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Taejin Chun: Innovator in Anomaly Detection Technology

Introduction

Taejin Chun is a notable inventor based in San Jose, California. He has made significant contributions to the field of anomaly detection, particularly in the context of in-vehicle networks. His innovative approach addresses critical challenges in automotive technology.

Latest Patents

Taejin Chun holds a patent for an "Anomaly detection method, anomaly detection device, and recording medium." This patent outlines a method for detecting anomalies in an in-vehicle network system that includes multiple electronic control units. The method involves generating image data of message reception intervals and classifying this data using a trained convolutional neural network (CNN) to identify potential attack messages.

Career Highlights

Taejin Chun is currently employed at Panasonic Intellectual Property Corporation of America. His work focuses on developing advanced technologies that enhance the security and reliability of automotive systems. With a patent portfolio that includes 1 patent, he continues to push the boundaries of innovation in his field.

Collaborations

Taejin has collaborated with talented colleagues such as Nhan Lam Chi Vu and Hai-Anh Trinh. Their combined expertise contributes to the advancement of technology at Panasonic.

Conclusion

Taejin Chun's work in anomaly detection represents a significant step forward in automotive technology. His innovative methods and dedication to research continue to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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