Seongnam-si, South Korea

Tae Young Hong

USPTO Granted Patents = 2 

Average Co-Inventor Count = 2.4

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2021-2023

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2 patents (USPTO):Explore Patents

Title: Tae Young Hong: Innovator in Semiconductor Manufacturing

Introduction

Tae Young Hong is a notable inventor based in Seongnam-si, South Korea. He has made significant contributions to the field of semiconductor manufacturing through his innovative methods and systems. With a total of 2 patents, his work focuses on enhancing quality control and measurement processes in manufacturing.

Latest Patents

Tae Young Hong's latest patents include a "Method and system for controlling lot risk score based dynamic lot measurement on basis of equipment reliability index." This invention provides a method for calculating an equipment reliability index for specific processes in semiconductor manufacturing. It also determines whether to measure a semiconductor product based on the calculated risk score, allowing for improved quality monitoring and management.

Another significant patent is the "Method and system for sensing fine changes in processing/equipment measurement data." This invention enables the detection of fine changes in measurement data, allowing for pre-estimation of potential quality variability and quick preemptive actions to prevent quality degradation.

Career Highlights

Tae Young Hong is currently employed at Sk Holdings Co., Ltd., where he continues to develop innovative solutions in semiconductor technology. His work has been instrumental in advancing the efficiency and reliability of manufacturing processes.

Collaborations

Tae Young Hong has collaborated with notable colleagues, including Byung Min Lee and Myung Seung Son. Their combined expertise contributes to the innovative environment at Sk Holdings Co., Ltd.

Conclusion

Tae Young Hong is a prominent figure in the semiconductor industry, recognized for his innovative patents that enhance manufacturing processes. His contributions significantly impact quality control and measurement in semiconductor production.

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