Gwangju, South Korea

Tae Il Yoon

This inventor holds 1 USPTO granted patent. Top assignee: Gwangju Institute of Science and Technology. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tae Il Yoon. Retrieved from https://idiyas.com/inventor/tae-il-yoon-xhkenyrz

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Tae Il Yoon - Innovator in Acoustic Surface Wave Measurement

Introduction

Tae Il Yoon is a prominent inventor based in Gwangju, South Korea. He has made significant contributions to the field of acoustic surface wave measurement through his innovative patent. His work focuses on utilizing advanced techniques to enhance the accuracy of surface wave velocity measurements.

Latest Patents

Tae Il Yoon holds a patent for an "Apparatus and method for measuring velocity of acoustic surface wave using full-field laser ultrasound imaging technique." This invention relates to a method that includes emitting a laser pulse to a target material, obtaining a wavefront image of a surface wave propagating on the material's surface, and determining the velocity of the surface wave based on the variation of the wavefront image over time. He has 1 patent to his name.

Career Highlights

Tae Il Yoon is affiliated with the Gwangju Institute of Science and Technology, where he conducts research and development in his area of expertise. His work has been instrumental in advancing the understanding of acoustic surface waves and their applications.

Collaborations

Some of his notable coworkers include Byeong Ha Lee and Young Gue Kim, who have collaborated with him on various projects related to his research.

Conclusion

Tae Il Yoon's innovative approach to measuring acoustic surface waves has positioned him as a key figure in his field. His contributions continue to influence research and development in acoustic measurement technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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