Suwon, South Korea

Tae Hwan Eom

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: U Electronics Co., Ltd.. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tae Hwan Eom. Retrieved from https://idiyas.com/inventor/tae-hwan-eom

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: Innovations of Tae Hwan Eom in Temperature Measurement Technology.

Introduction

Tae Hwan Eom is a notable inventor based in Suwon, South Korea. He has made significant contributions to the field of temperature measurement technology. His innovative approach utilizes advanced thermal imaging techniques to enhance accuracy and efficiency in temperature measurement.

Latest Patents

Tae Hwan Eom holds a patent for a "Temperature measuring device and method using thermal imaging camera, and computer-readable recording medium." This invention includes a first operation module that obtains a curve of temperature difference versus output code difference. The second operation module derives a function of temperature difference versus output code difference, which is curve-fitted using the previously obtained data. Finally, the third operation module measures the temperature of an object by applying the curve-fitted function.

Career Highlights

Eom is currently employed at U Electronics Co., Ltd., where he continues to develop innovative solutions in temperature measurement. His work has been instrumental in advancing the capabilities of thermal imaging technology.

Collaborations

Tae Hwan Eom collaborates with talented coworkers, including Min Kyu Lee and Hyung Won Kim. Their combined expertise fosters a creative environment that drives innovation within their projects.

Conclusion

Tae Hwan Eom's contributions to temperature measurement technology exemplify the impact of innovative thinking in engineering. His patent reflects a commitment to improving measurement accuracy through advanced technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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