Tae Hun Jin

Title: Tae Hun Jin and His Chip Verification Invention.

Introduction

Tae Hun Jin is an inventor associated with Kyungki-Do, South Korea. His patent work addresses chip verification, with a method intended to make the design process more efficient and verification results more exact.

Latest Patents

Jin is associated with 1 patent, titled “Verification Method by Means of Comparing Internal State Traces.” The invention compares internal state traces from a target chip and a function verification chip model during program execution.

The method executes an application program in virtual systems modeled with a hardware description language. It records the target chip’s internal state after each command in a trace file, then compares those states with the corresponding states of the verification model. If the states match, execution continues; if they differ, the method outputs the internal state and stops execution. This approach is designed to reduce overall chip design and verification time while supporting more exact verification.

Career Highlights

Jin’s listed company affiliation is Hyundai Electronics Industries Co., Ltd. His patent reflects work on verification techniques used during the chip design stage.

Collaborations

Jin’s listed coworker is Jong Hong Bae. The available information identifies their association but does not specify further details about their collaboration.

Conclusion

Tae Hun Jin’s patent presents a trace-comparison approach to chip verification that aims to streamline design workflows and identify differences between a target chip and its verification model.