Gunpo, South Korea

Tae Hoon Kim

This inventor holds 1 USPTO granted patent. Top assignee: Ilooda Co., Ltd.. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tae Hoon Kim. Retrieved from https://idiyas.com/inventor/tae-hoon-kim-iom4n9dc

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: Tae Hoon Kim: Innovator in Temperature Measurement Technology.

Introduction

Tae Hoon Kim is a notable inventor based in Gunpo-si, South Korea. He has made significant contributions to the field of temperature measurement technology. His innovative approach focuses on creating devices that are both efficient and cost-effective.

Latest Patents

One of Tae Hoon Kim's most recent patents is a temperature measuring device designed for tracked subject target regions. This invention relates to a non-contact temperature measuring device that offers a simpler configuration at a lower cost compared to traditional thermal imaging cameras. The device utilizes a general camera to recognize movable target objects and accurately measure their temperature. It is equipped with features that allow for the recognition of position information and correction of errors based on distance or angle, ensuring precise temperature measurements.

Career Highlights

Tae Hoon Kim is associated with Ilooda Co., Ltd., where he continues to develop innovative technologies. His work has garnered attention for its practical applications and advancements in temperature measurement.

Collaborations

Some of his notable coworkers include Sang Joon Lee and Dong Wook Kim, who contribute to the collaborative efforts at Ilooda Co., Ltd.

Conclusion

Tae Hoon Kim's contributions to temperature measurement technology exemplify innovation and practicality. His work continues to influence the industry and improve measurement techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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