Saitama, Japan

Tadataka Ohe

This inventor holds 4 USPTO granted patents. Top assignees: Takeshi Ikeda, Other. Active years: 1999-2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tadataka Ohe. Retrieved from https://idiyas.com/inventor/tadataka-ohe

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.8

ph-index = 3

Forward Citations = 87(Granted Patents)


Location History:

  • Ohmiya-shi Saitama JP (1999)
  • Saitama, JP (2000)

Company Filing History:


Years Active: 1999-2000

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4 patents (USPTO):Explore Patents

Title: The Innovations of Tadataka Ohe

Introduction

Tadataka Ohe is a notable inventor based in Saitama, Japan. He has made significant contributions to the field of technology, particularly in the area of tuning circuits. With a total of 4 patents to his name, Ohe's work reflects his dedication to innovation and advancement.

Latest Patents

Among his latest patents, Ohe has developed a tuning circuit that includes a plurality of cascade connected tuning elements. This invention showcases his ability to enhance the functionality and efficiency of tuning circuits, which are essential in various electronic applications.

Career Highlights

Throughout his career, Ohe has worked with various companies, contributing his expertise to the development of advanced technologies. His innovative spirit and technical skills have positioned him as a valuable asset in the industry.

Collaborations

Ohe has collaborated with notable individuals such as Takeshi Ikeda and Tsutomu Nakanishi. These partnerships have allowed him to expand his knowledge and influence in the field of invention.

Conclusion

Tadataka Ohe's contributions to technology through his patents and collaborations highlight his role as a significant inventor in Japan. His work continues to inspire future innovations in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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