Tokyo, Japan

Tadashiro Kondo

This inventor holds 1 USPTO granted patent. Top assignee: Mitsubishi Electric Corporation. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tadashiro Kondo. Retrieved from https://idiyas.com/inventor/tadashiro-kondo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Innovations by Tadashiro Kondo

Introduction

Tadashiro Kondo is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of crack detection technology. His work focuses on enhancing the safety and maintenance of road surfaces through innovative devices and methods.

Latest Patents

Kondo holds a patent for a "Crack detection device, crack detection method and computer readable medium." This invention involves a crack detection device that utilizes an image acquisition unit to capture image data of road surfaces from an oblique angle. The device classifies the acquired image data into acceptable and unacceptable ranges based on resolution. The output data helps in detecting cracks on the road surface, thereby improving road safety.

Career Highlights

Tadashiro Kondo is associated with Mitsubishi Electric Corporation, where he has been instrumental in developing advanced technologies. His expertise in image processing and data analysis has led to innovative solutions in infrastructure maintenance.

Collaborations

Kondo has worked alongside talented colleagues such as Mitsunobu Yoshida and Taichi Ishifuji. Their collaborative efforts have contributed to the success of various projects within the company.

Conclusion

Tadashiro Kondo's contributions to crack detection technology exemplify the importance of innovation in ensuring road safety. His patent reflects a commitment to improving infrastructure through advanced technological solutions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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