Tokyo, Japan

Tadashi Tamukai

This inventor holds 1 USPTO granted patent. Top assignee: Asia Electronics, Inc.. Active years: 2001.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tadashi Tamukai. Retrieved from https://idiyas.com/inventor/tadashi-tamukai

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 133(Granted Patents)


Company Filing History:


Years Active: 2001

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1 patent (USPTO):Explore Patents

Title: The Innovations of Tadashi Tamukai

Introduction

Tadashi Tamukai is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of electronics, particularly in the area of liquid crystal display (LCD) technology. His innovative approach has led to the development of a unique method for inspecting pixel capacitances in LCD arrays.

Latest Patents

Tadashi Tamukai holds a patent for a TFT array inspection method and device. This invention allows for the easy and rapid inspection of pixel capacitances in an LCD array without interference from the capacitance of the testing system. The method involves charging pixel capacitance with pixel voltage and measuring the difference voltage after connecting it in parallel with line capacitance. This process enables accurate determination of pixel capacitance using derived equations from the measured voltages.

Career Highlights

Tamukai is currently employed at Asia Electronics, Inc., where he continues to innovate and contribute to advancements in electronic technologies. His work has been instrumental in enhancing the efficiency and effectiveness of LCD array inspections.

Conclusion

Tadashi Tamukai's contributions to the field of electronics, particularly through his patented inspection method, highlight his role as a significant inventor in the industry. His work not only improves the inspection process but also showcases the importance of innovation in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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