Kanagawa, Japan

Tadashi Kiyuna

This inventor holds 1 USPTO granted patent. Top assignee: Ablic Inc.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tadashi Kiyuna. Retrieved from https://idiyas.com/inventor/tadashi-kiyuna-s8m574ys

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: The Innovations of Tadashi Kiyuna

Introduction

Tadashi Kiyuna is a notable inventor based in Kanagawa, Japan. He has made significant contributions to the field of semiconductor device manufacturing. His innovative work has led to the development of a unique layout design support apparatus.

Latest Patents

Kiyuna holds a patent for a layout design support apparatus, layout design support method, and manufacturing method of semiconductor devices. This patent involves a sophisticated process that determines whether to short-circuit terminals in a circuit element based on specific criteria. The apparatus adds potential identification labels to circuit components, allowing for the identification of equipotential regions, which is crucial for effective semiconductor design.

Career Highlights

Kiyuna's career is marked by his dedication to advancing semiconductor technology. His work at Ablic Inc. has positioned him as a key player in the industry. His innovative approaches have not only enhanced the efficiency of semiconductor devices but have also contributed to the overall progress in electronic design.

Collaborations

Due to space constraints, the details of Kiyuna's collaborations will not be included.

Conclusion

Tadashi Kiyuna's contributions to semiconductor technology through his innovative patent demonstrate his expertise and commitment to the field. His work continues to influence the design and manufacturing processes in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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