This inventor holds 1 USPTO granted patent and 3 published patent applications and 1 EPO patent. Top assignee: Fujifilm Corporation. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: The Innovative Contributions of Tadashi Kajiya
Introduction
Tadashi Kajiya is a notable inventor based in Kanagawa, Japan. He has made significant contributions to the field of physical property measurement. His work focuses on developing methods and devices that enhance the measurement of physical properties in various materials.
Latest Patents
Kajiya holds a patent for a physical property measurement method, physical property measurement device, and probe. This invention allows for the simple measurement of physical properties of the surface layer portion of an object. The method involves bringing a probe into contact with the surface layer of a liquid or gel-like object, measuring the height of the object that rises along the probe, and calculating the viscous or elastic properties of the surface layer using the measured height.
Career Highlights
Tadashi Kajiya is associated with Fujifilm Corporation, where he applies his expertise in physical property measurement. His innovative approach has contributed to advancements in the field, making significant impacts on research and development.
Collaborations
Kajiya has worked alongside talented colleagues such as Daisuke Sawai and Koji Miyata. Their collaborative efforts have furthered the development of innovative measurement techniques.
Conclusion
Tadashi Kajiya's work exemplifies the spirit of innovation in the field of physical property measurement. His contributions continue to influence advancements in technology and research.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile