Katsuta, Japan

Tadao Ishii

This inventor holds 1 USPTO granted patent. Top assignee: Hitachi, Ltd.. Active years: 1988.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tadao Ishii. Retrieved from https://idiyas.com/inventor/tadao-ishii-0f4k9utj

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 1988

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1 patent (USPTO):Explore Patents

Title: Tadao Ishii: Innovator in Spectrofluorophotometry

Introduction

Tadao Ishii is a notable inventor based in Katsuta, Japan. He has made significant contributions to the field of optical measurement technology. His work primarily focuses on the development of advanced spectrofluorophotometers.

Latest Patents

Ishii holds a patent for a "Spectrofluorophotometer with monitor detector for light source." This innovative device enables highly accurate spectrum correcting treatment. It includes an interceptor for the incident light in a fluorescence detecting system, as well as an interceptor for the incident light in a monitoring detecting system. This design allows for zero point correction for both detecting systems, enhancing measurement precision.

Career Highlights

Tadao Ishii is associated with Hitachi, Ltd., a leading company in technology and innovation. His work at Hitachi has allowed him to contribute to various advancements in optical measurement devices. His expertise in this area has positioned him as a key figure in the development of high-precision instruments.

Collaborations

Ishii has collaborated with notable colleagues such as Hiroyuki Koshi and Shunichi Matuura. These partnerships have fostered innovation and have led to the development of cutting-edge technologies in their field.

Conclusion

Tadao Ishii's contributions to the field of spectrofluorophotometry exemplify his dedication to innovation and precision in optical measurement technology. His work continues to influence advancements in this important area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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