Company Filing History:
Years Active: 1986-1987
Title: T Charles Podvin: Innovator in Microscopic Examination Technologies
Introduction
T Charles Podvin is a notable inventor based in Poway, California. He has made significant contributions to the field of microscopic examination technologies, holding a total of 5 patents. His work focuses on enhancing the precision and efficiency of examining flat objects, particularly in the context of photomasks and membranes.
Latest Patents
Among his latest patents is an "Apparatus for positioning flat objects for microscopic examination." This innovative apparatus is designed to guide pellicle-covered photomasks or other flat objects into the correct viewing position for inspection. It features a pair of spaced parallel rails with inwardly extending flanges that define keyways for the photomask-carrying paddle. The design includes recessed segments to protect the pellicle membrane and facilitate a smooth vertical dropping movement of the paddle.
Another significant patent is for "Microscopic detection of membrane surface defects through interference." This method involves examining transparent membranes using a microscope equipped with coaxial brightfield illumination and a narrow bandwidth filter. The technique allows for the detection of surface aberrations through observable interference patterns, making it particularly useful for pellicles and photo-resist layers.
Career Highlights
T Charles Podvin is currently associated with The Micromanipulator Microscope Company, Inc., where he continues to develop innovative solutions for microscopic examination. His expertise in this niche field has positioned him as a key figure in advancing technologies that enhance the accuracy of microscopic inspections.
Collaborations
Throughout his career, Podvin has collaborated with notable colleagues, including Peter J Van Benschoten and James T Pettingell. These collaborations have contributed to the development of cutting-edge technologies in the field.
Conclusion
T Charles Podvin's contributions to microscopic examination technologies have significantly impacted the industry. His innovative patents and ongoing work continue to push the boundaries of what is possible in the realm of microscopic analysis.