Pessac, France

Sébastien Fernandes

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Lectra. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sébastien Fernandes. Retrieved from https://idiyas.com/inventor/sébastien-fernandes

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

 

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2025

Loading Chart...
Loading Chart...
1 patent (USPTO):Explore Patents

Title: Sébastien Fernandes: Innovator in Automated Fabric Cutting

Introduction

Sébastien Fernandes is a notable inventor based in Pessac, France. He has made significant contributions to the field of automated fabric cutting, showcasing his innovative spirit and technical expertise.

Latest Patents

Sébastien Fernandes holds a patent for a method for laying out pieces to be cut automatically into a patterned fabric. This method involves determining a list of pieces to be placed on the fabric, calculating a contour around each piece to avoid overlap, and developing a theoretical placement of the pieces while considering various constraints. His innovative approach enhances the efficiency and accuracy of fabric cutting processes.

Career Highlights

Sébastien Fernandes is associated with Lectra, a company renowned for its cutting-edge technology in the textile and fashion industries. His work at Lectra has allowed him to apply his inventive ideas in practical applications, contributing to advancements in automated fabric cutting.

Collaborations

Sébastien has collaborated with talented coworkers such as Stéphane Barbe and Patrick Moreau. Their combined expertise fosters a creative environment that drives innovation within their projects.

Conclusion

Sébastien Fernandes exemplifies the spirit of innovation in the textile industry through his patented methods and contributions at Lectra. His work continues to influence the way fabrics are cut and utilized in various applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…