Tokyo, Japan

Syuji Ohtawa

This inventor holds 1 USPTO granted patent. Top assignee: Seiko Instruments Inc. Active years: 1988.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Syuji Ohtawa. Retrieved from https://idiyas.com/inventor/syuji-ohtawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 1988

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1 patent (USPTO):Explore Patents

Title: Syuji Ohtawa - Innovator in Electronic Timekeeping

Introduction

Syuji Ohtawa is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of electronic timekeeping. His innovative approach has led to the development of a unique electronic analog timepiece.

Latest Patents

Ohtawa holds a patent for an "Electronic analog timepiece with voltage checking function." This invention detects the power source condition and informs the user of the necessity for charging. The device translates the magnitude of the power source voltage into the distance the hand moves, providing a visual indication of the battery status. Additionally, the hand is temporarily stopped during the initial voltage checking operation.

Career Highlights

Syuji Ohtawa is associated with Seiko Instruments Inc., a company renowned for its advancements in timekeeping technology. His work has contributed to enhancing the functionality and user experience of electronic timepieces.

Collaborations

Ohtawa has collaborated with notable colleagues, including Hitoshi Ochiai and Hiroshi Odagiri. Their combined expertise has fostered innovation within the company.

Conclusion

Syuji Ohtawa's contributions to electronic timekeeping exemplify the spirit of innovation. His patent reflects a commitment to improving user interaction with technology. His work continues to influence the industry and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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