Hitachi, Japan

Syuichi Nagayama



Average Co-Inventor Count = 12.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Syuichi Nagayama: Innovator in Fault Diagnosis Technology

Introduction

Syuichi Nagayama is a notable inventor based in Hitachi, Japan. He has made significant contributions to the field of fault diagnosis in multi-channel analog input/output circuits. His innovative work has led to the development of a unique apparatus and method that enhances the reliability of electronic systems.

Latest Patents

Syuichi Nagayama holds a patent for a "Fault diagnosis apparatus and fault diagnosis method of multi-channel analog input/output circuit." This invention is designed to simultaneously detect faults in both a multiplexer and an A/D converter. It isolates and identifies the causes of these faults, ensuring that the multiplexer and A/D converter function effectively within a multi-channel analog input/output circuit. The apparatus inputs test-voltage values from a diagnosis-voltage input unit into the multiplexer and A/D converter, which are crucial for converting analog signals into digital formats. By comparing digital voltage values with the inputted test-voltage values, the system can determine whether the fault lies with the multiplexer or the A/D converter.

Career Highlights

Syuichi Nagayama is associated with Hitachi, Ltd., a leading company in technology and innovation. His work has been instrumental in advancing fault diagnosis methods, contributing to the reliability and efficiency of electronic devices.

Collaborations

Syuichi has collaborated with notable colleagues, including Hisashi Terae and Masakazu Ishikawa. Their combined expertise has furthered the development of innovative solutions in the field of fault diagnosis.

Conclusion

Syuichi Nagayama's contributions to fault diagnosis technology exemplify the importance of innovation in enhancing electronic systems. His patent reflects a significant advancement in the ability to detect and isolate faults, ensuring the reliability of multi-channel analog input/output circuits.

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