The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2013
Filed:
Feb. 18, 2010
Hisashi Terae, Hitachi, JP;
Masakazu Ishikawa, Hitachi, JP;
Yasuyuki Furuta, Tokai, JP;
Katsumi Yoshida, Hitachi, JP;
Atsushi Nishioka, Hitachi, JP;
Yasuhiro Kiyofuji, Hitachi, JP;
Takenori Kasahara, Tokai, JP;
Syuichi Nagayama, Hitachi, JP;
Fujiya Kawawa, Mito, JP;
Manabu Kubota, Hitachi, JP;
Tatsuyuki Ootani, Hitachi, JP;
Hidechiyo Tanaka, Hitachiota, JP;
Hisashi Terae, Hitachi, JP;
Masakazu Ishikawa, Hitachi, JP;
Yasuyuki Furuta, Tokai, JP;
Katsumi Yoshida, Hitachi, JP;
Atsushi Nishioka, Hitachi, JP;
Yasuhiro Kiyofuji, Hitachi, JP;
Takenori Kasahara, Tokai, JP;
Syuichi Nagayama, Hitachi, JP;
Fujiya Kawawa, Mito, JP;
Manabu Kubota, Hitachi, JP;
Tatsuyuki Ootani, Hitachi, JP;
Hidechiyo Tanaka, Hitachiota, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A fault diagnosis apparatus and method capable of simultaneously detecting the fault of a multiplexer and the fault of an A/D converter and isolating and identifying causes of these faults, the multiplexer and the A/D converter being used in a multi-channel analog input/output circuit. Test-voltage values are inputted from a diagnosis-voltage input unit into the multiplexer and the A/D converter constituting an analog-signal conversion unit, the multiplexer having plural channels, the A/D converter converting outputs from the multiplexer into digital signals, the test-voltage values being different from each other for each channel of the multiplexer. Comparisons are made between the digital voltage values and the test-voltage values inputted, the digital voltage values being outputted for each channel of the multiplexer. From this comparison result, it is judged whether the multiplexer is at fault or the A/D converter is at fault.