Laval, Canada

Sylvain Dion

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Abb Bomem Inc.. Active years: 2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sylvain Dion. Retrieved from https://idiyas.com/inventor/sylvain-dion-9gu1r1ve

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: Sylvain Dion: Innovator in Optical Analysis Technology

Introduction

Sylvain Dion is a notable inventor based in Laval, Canada. He has made significant contributions to the field of optical analysis, particularly through his innovative patent that enhances the analysis of substances in process lines.

Latest Patents

Sylvain Dion holds a patent for an "On-line optical analysis of a substance through a conduit section of a process line." This invention features a conduit-mounted light-transmitting device designed to facilitate optical analysis of substances within a process line conduit made of light-transmitting material. The device includes a clip that can be detachably secured around the conduit section, defining an optical path that intersects the conduit when mounted.

Career Highlights

Dion is associated with Abb Bomem Inc., where he applies his expertise in optical technologies. His work has been instrumental in advancing methods for real-time analysis in various industrial applications.

Collaborations

Some of his notable coworkers include Henry L. Buijs and Paul Chabot, who have collaborated with him on various projects within the company.

Conclusion

Sylvain Dion's contributions to optical analysis technology exemplify the innovative spirit that drives advancements in industrial processes. His patent reflects a commitment to improving analytical methods, showcasing the importance of innovation in today's technological landscape.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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