Middlesex, NJ, United States of America

Syed Kausar A Zaidi

This inventor holds 1 USPTO granted patent. Top assignee: Zt Group Int'l, Inc.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Syed Kausar A Zaidi. Retrieved from https://idiyas.com/inventor/syed-kausar-a-zaidi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Syed Kausar A Zaidi: Innovator in Drop Testing Technology.

Introduction

Syed Kausar A Zaidi is an accomplished inventor based in Middlesex, NJ (US). He has made significant contributions to the field of drop testing technology, showcasing his innovative spirit and technical expertise.

Latest Patents

One of his notable patents is for a "Holder for Drop Tester." This invention features a holder that includes a body and a plurality of fingers. Each of the fingers is operable to be translatable within the body, allowing for modifications in the configuration of the fingers. The design enables the fingers to be reconfigured to correspond with a drop unit, ensuring that the drop unit is held in a desired orientation between the fingers and a drop leaf of a drop tester. This patent highlights his ingenuity and understanding of practical applications in testing equipment.

Career Highlights

Syed Kausar A Zaidi is currently associated with ZT Group International, Inc., where he continues to develop innovative solutions in his field. His work reflects a commitment to advancing technology and improving testing methodologies.

Conclusion

Syed Kausar A Zaidi is a notable inventor whose contributions to drop testing technology exemplify his innovative capabilities. His patent for a holder in drop testers demonstrates his ability to create practical solutions that enhance testing processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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