Nybro, Sweden

Sven Tagerud

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Other. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sven Tagerud. Retrieved from https://idiyas.com/inventor/sven-tagerud

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile



Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 12(Granted Patents)


Company Filing History:

goldMedal1 out of 834,513 
Other
 patents

Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Sven Tagerud: Innovator in Detection Conjugates

Introduction

Sven Tagerud is a notable inventor based in Nybro, Sweden. He has made significant contributions to the field of detection conjugates, showcasing his innovative spirit and dedication to advancing scientific knowledge.

Latest Patents

Sven Tagerud holds a patent for a detection conjugate. This invention relates to a detection conjugate composed of a filament fragment, such as a cytoskeletal filament like actin filaments or microtubules. The detection conjugate includes recognition elements bound to this fragment, along with kits that comprise the detection conjugate. It also outlines methods for using the detection conjugate and its application for detecting one or more compounds present within a sample, such as a biological sample. He has 1 patent to his name.

Career Highlights

Throughout his career, Sven has worked in various capacities, contributing to the development of innovative solutions in his field. His work has been instrumental in enhancing the understanding and application of detection technologies.

Collaborations

Sven Tagerud has collaborated with Alf Månsson, further enriching his professional journey and expanding the impact of his inventions.

Conclusion

Sven Tagerud's contributions to the field of detection conjugates highlight his innovative capabilities and commitment to scientific advancement. His work continues to influence the detection technologies used in various applications today.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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