This inventor holds 1 USPTO granted patent and 6 published patent applications. Top assignee: Samsung Electronics Ltd.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Suyoung Lee and His Patent for Defect Inspection
Introduction
Suyoung Lee is an inventor based in Suwon, South Korea. The supplied information identifies him as a man working at Samsung Electronics Ltd. and credits him with 1 patent.
Latest Patents
Lee’s listed patent is titled “Method of Inspecting Defects.” It describes a process for aligning an inspection image with a reference image before checking for defects. The method identifies image peaks that mark pattern positions, filters the images, and selects reference peaks as samples. It then calculates candidate correction constants, chooses a primary correction constant, and applies further corrections to align the reference image with the inspection image. Once aligned, the method compares the inspection patterns with the reference patterns to identify defects.
Career Highlights
The available information highlights Lee’s work on image alignment and automated defect inspection, as described in his patent. His listed professional affiliation is Samsung Electronics Ltd.
Collaborations
The supplied information names Bumjoo Lee as Suyoung Lee’s coworker. No further details about their collaboration are provided.
Conclusion
Suyoung Lee’s listed invention focuses on accurately aligning inspection and reference images to support defect detection, reflecting a practical contribution to inspection technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile