Bengaluru, India

Surya Charan Alluri


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2018

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1 patent (USPTO):

Title: Surya Charan Alluri: Innovator in Containerized Application Networking

Introduction

Surya Charan Alluri is a notable inventor based in Bengaluru, India. He has made significant contributions to the field of cloud computing, particularly in the area of containerized applications. His innovative work focuses on enhancing the efficiency and reliability of network parameters in cloud environments.

Latest Patents

Surya holds a patent for "Validating network parameters of a containerized application." This patent describes a method for validating the current state of network parameters configured for a containerized application in a cloud computing environment. The process involves comparing the current state of these parameters against a predefined container application profile, which specifies the desired state. If discrepancies are found, the system determines whether a suitable network interface is available, allowing for the migration of the containerized application to meet the desired network conditions.

Career Highlights

Surya Charan Alluri is currently employed at Hewlett Packard Enterprise Development LP, where he continues to innovate and develop solutions that enhance cloud computing technologies. His work is instrumental in improving the performance and reliability of applications deployed in cloud environments.

Collaborations

Surya collaborates with talented professionals in his field, including Swaroop Jayanthi and Brahmanand Vuppuluri. These collaborations foster a creative environment that drives innovation and leads to the development of cutting-edge technologies.

Conclusion

Surya Charan Alluri is a pioneering inventor whose work in validating network parameters for containerized applications is shaping the future of cloud computing. His contributions are vital for enhancing the performance and reliability of applications in this rapidly evolving field.

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