New York, NY, United States of America

Suri Hegde

This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 2001.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Suri Hegde. Retrieved from https://idiyas.com/inventor/suri-hegde

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:

goldMedal1 out of 834,601 
Other
 patents

Years Active: 2001

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Suri Hegde: Innovator in Oxide Technology

Introduction

Suri Hegde is a prominent inventor based in New York, NY (US). She has made significant contributions to the field of semiconductor technology, particularly through her innovative patent.

Latest Patents

Suri holds a patent for the "Dual gate oxide process for uniform oxide thickness." This invention addresses critical challenges in achieving consistent oxide thickness, which is essential for the performance of semiconductor devices. Her work in this area has the potential to enhance the efficiency and reliability of various electronic components.

Career Highlights

Throughout her career, Suri has demonstrated a strong commitment to advancing technology. She has focused on developing processes that improve the manufacturing of semiconductor materials. Her expertise in oxide technology has positioned her as a valuable contributor to the field.

Collaborations

Suri has collaborated with notable professionals in her field, including Stephan Kudelka and Oleg Gluschenkov. These partnerships have allowed her to expand her research and contribute to innovative solutions in semiconductor technology.

Conclusion

Suri Hegde is a talented inventor whose work in oxide technology is paving the way for advancements in the semiconductor industry. Her contributions are noteworthy and reflect her dedication to innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…