Company Filing History:
Years Active: 1997-1999
Title: Suresh N Rajan: Innovator in Voltage Probing Technology
Introduction
Suresh N Rajan is a notable inventor based in San Jose, CA, who has made significant contributions to the field of integrated circuit testing. With a total of 2 patents, his work focuses on advanced techniques for voltage probing and waveform acquisition.
Latest Patents
Rajan's latest patents include innovative technologies such as dual-laser voltage probing of integrated circuits (ICs) and predictive waveform acquisition. The dual-laser voltage probing technique utilizes a probe beam to sample the waveform on an IC device under test (DUT) during each cycle of a test pattern. A reference laser beam is also employed to sample the DUT, allowing for measurements at the same physical location but at different times. This method significantly reduces noise fluctuations, requiring fewer averages to reconstruct the waveform accurately.
The predictive waveform acquisition patent describes a system where a tester exercises a DUT with a repetitive signal pattern. It involves measuring voltage at various sample points using a charged-particle probe system. The system employs a predictive scheme to set the filter voltage needed for accurate measurements, minimizing the time required to settle the loop. This adaptive approach enhances measurement efficiency and accuracy.
Career Highlights
Suresh N Rajan is currently employed at Schlumberger Technologies, Inc., where he continues to develop and refine his innovative technologies. His work has had a profound impact on the testing and analysis of integrated circuits, contributing to advancements in the field.
Collaborations
Rajan has collaborated with notable colleagues, including Kenneth R Wilsher and William K Lo, who have also contributed to the development of technologies in the field of integrated circuit testing.
Conclusion
Suresh N Rajan's contributions to voltage probing technology and waveform acquisition demonstrate his commitment to innovation in the field of integrated circuits. His patents reflect a deep understanding of the challenges in testing and provide solutions that enhance measurement accuracy and efficiency.