Seongnam-si, South Korea

Sungwan Kim

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: 3A Logics Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sungwan Kim. Retrieved from https://idiyas.com/inventor/sungwan-kim-rl0hqdtu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Sungwan Kim and His NFC-Linked Two-Dimensional Barcode Invention.

Introduction

Sungwan Kim is an inventor based in Seongnam-si, South Korea. His work includes a patent for generating a variable two-dimensional barcode linked to information stored on an NFC tag. He is associated with 3A Logics Inc.

Latest Patents

Kim’s listed patent is titled “Device for Generating Two-Dimensional Barcode Inked to NFC Data Using NFC Tag.” The invention describes a device with an NFC tag that stores URL information for accessing a webpage and collects electromagnetic waves emitted by a portable device to generate an antenna voltage. A controller uses that voltage to read the URL information, generate a corresponding two-dimensional barcode in real time, and display it. Kim is credited with 1 patent.

Career Highlights

The patent reflects Kim’s work at the intersection of near-field communication and dynamic barcode generation. By linking an NFC tag’s stored URL to a barcode displayed in real time, the device provides a way to present web access information through a visual code.

Collaborations

Kim is associated with 3A Logics Inc., the company connected with his listed invention.

Conclusion

Sungwan Kim’s patented device combines NFC data with real-time two-dimensional barcode generation, illustrating his contribution to technologies that connect physical tags with digital information.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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