Seoul, South Korea

Sunghoon Bae

This inventor holds 1 USPTO granted patent. Top assignee: Willog Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sunghoon Bae. Retrieved from https://idiyas.com/inventor/sunghoon-bae-oklgve8l

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Sunghoon Bae: Inventor in Marine Cargo Monitoring

Introduction

Sunghoon Bae is an inventor based in Seoul, South Korea, whose patent work addresses the monitoring and correction of environmental conditions during ship transport. His disclosed invention focuses on temperature and humidity information for cargo carried aboard a vessel.

Latest Patents

Bae is associated with 1 patent: “Device and Method for Sensing and Correcting Marine Transportation Environment of Ship.” The invention describes a processor that receives temperature and humidity readings for ship cargo from an external source. It checks those readings against information such as the ship’s GPS location or estimated arrival time along its route, then corrects the transport-environment information based on the verification results.

Career Highlights

Bae is associated with Willog Co., Ltd. His patent reflects work on using location and voyage information to assess cargo-condition readings and improve the reliability of environmental data during marine transportation.

Collaborations

The provided information identifies Jihyun Yun and Jaehwan Kim as Bae’s coworkers. It does not specify their roles in the patent or the extent of their collaboration.

Conclusion

Sunghoon Bae’s disclosed invention combines cargo temperature and humidity sensing with voyage-related verification to support more reliable monitoring of marine transport conditions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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