This inventor holds 1 USPTO granted patent. Top assignee: Hana Micron America, Inc.. Active years: 2014.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2014
Title: Innovations by Sung Ryol Jin in RFID Technology.
Introduction
Sung Ryol Jin is an accomplished inventor based in Milpitas, CA (US). He has made significant contributions to the field of RFID technology, particularly in quality assurance and reliability testing.
Latest Patents
Sung Ryol Jin holds a patent for a "Quality assurance and reliability testing apparatus for RFID tags." This innovative apparatus is designed to execute a bending test sequence for RFID tags, helping to identify defective tags that cannot withstand external bending pressures. By utilizing this technology, manufacturers can enhance the quality assurance and reliability of RFID tags, ultimately reducing premature failures in real-life applications.
Career Highlights
Sung Ryol Jin is currently employed at Hana Micron America, Inc., where he continues to develop and refine technologies related to RFID systems. His work focuses on improving the durability and performance of RFID tags, which are essential in various industries.
Collaborations
Sung Ryol Jin collaborates with his coworker, Yong Hyun Lee, to advance their research and development efforts in RFID technology. Their combined expertise contributes to the innovative solutions being developed at Hana Micron America, Inc.
Conclusion
Sung Ryol Jin's contributions to RFID technology through his innovative patent demonstrate his commitment to enhancing product reliability and quality. His work is vital in ensuring that RFID tags perform effectively in real-world applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile