Daejeon, South Korea

Sung Myun Kim

This inventor holds 1 USPTO granted patent. Top assignee: Eb-Tech Co., Ltd.. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sung Myun Kim. Retrieved from https://idiyas.com/inventor/sung-myun-kim

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Innovations of Sung Myun Kim in Electron Acceleration Technology.

Introduction

Sung Myun Kim is a notable inventor based in Daejeon, South Korea. He has made significant contributions to the field of electron acceleration technology. His innovative approach focuses on enhancing the safety and efficiency of electron beam applications.

Latest Patents

One of his key patents is for a mobile type electron accelerator. This invention allows for a high voltage generator and a beam extraction device to be safely housed in containers mounted on vehicle trailers. The design enables real-time testing of various samples, such as wastewater and waste gas, while minimizing the risks of environmental pollution and radiation exposure. This innovation assures rapidity, field applicability, and accuracy in testing.

Career Highlights

Sung Myun Kim is associated with Eb-tech Co., Ltd., where he continues to develop and refine his inventions. His work has garnered attention for its practical applications in environmental safety and monitoring.

Collaborations

He collaborates with talented individuals such as Won Gu Kang and Jin Kyu Kim, contributing to a dynamic team focused on advancing technology in their field.

Conclusion

Sung Myun Kim's contributions to electron acceleration technology exemplify the intersection of innovation and environmental safety. His work continues to pave the way for advancements in real-time testing and monitoring solutions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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