Company Filing History:
Years Active: 2006
Title: Innovations by Sung-gon Ryu in Wafer Technology
Introduction
Sung-gon Ryu is a notable inventor based in Suwon, South Korea. He has made significant contributions to the field of semiconductor technology, particularly in methods for improving wafer quality and defect detection.
Latest Patents
Sung-gon Ryu holds a patent for a "Wafer color variation correcting method, selective wafer defect detecting method, and computer readable recording media for the same." This innovative method addresses color variations on the surface of a wafer by utilizing the mean and standard deviation of grey level values for the pixels in different parts of the wafer. Additionally, it employs different threshold values for metal interconnect patterns and spaces, allowing for the selective detection of defects. This approach enhances the defect screening capacity, enabling more efficient management of defect detection processes.
Career Highlights
Sung-gon Ryu is associated with Samsung Electronics Co., Ltd., a leading company in the electronics and semiconductor industry. His work has contributed to advancements in wafer technology, which is crucial for the performance and reliability of semiconductor devices.
Collaborations
He has collaborated with colleagues such as Chung-Sam Jun and Sang-mun Chon, further enhancing the innovative efforts within his team.
Conclusion
Sung-gon Ryu's contributions to wafer technology exemplify the importance of innovation in the semiconductor industry. His patented methods for defect detection and color correction are vital for improving the quality and efficiency of semiconductor manufacturing.