Gangneung, South Korea

Sung Gi Kim

This inventor holds 1 USPTO granted patent. Top assignee: Sungkyunkwan University. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sung Gi Kim. Retrieved from https://idiyas.com/inventor/sung-gi-kim-1rlxuej0

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Innovations of Sung Gi Kim

Introduction

Sung Gi Kim is a notable inventor based in Gangneung-si, South Korea. He has made significant contributions to the field of sensor technology, particularly with his innovative designs that enhance the functionality of capacitive sensors.

Latest Patents

One of his key patents is a "Capacitor sensor capable of controlling sensitivity." This invention allows the capacitor sensor to measure both the magnitude and direction of shear forces applied to it, as well as the magnitude of normal forces on its surface. The design includes a single cell with a pattern electrode that can change shape to control the sensor's sensitivity. This innovation is particularly useful in various applications where precise force measurement is critical.

Career Highlights

Sung Gi Kim is affiliated with Sungkyunkwan University, where he continues to engage in research and development. His work at the university has allowed him to explore advanced sensor technologies and contribute to academic knowledge in this area.

Collaborations

He has collaborated with notable colleagues such as Ja Choon Koo and Hyouk Ryeol Choi, further enhancing the impact of his research through teamwork and shared expertise.

Conclusion

Sung Gi Kim's contributions to sensor technology, particularly through his patented innovations, demonstrate his commitment to advancing the field. His work not only reflects his expertise but also has the potential to influence various industries that rely on precise measurement technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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