Yongin, South Korea

Sun Ho Ryu

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Sdi., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sun Ho Ryu. Retrieved from https://idiyas.com/inventor/sun-ho-ryu-58ddjb56

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Sun Ho Ryu and Secondary Battery Life Evaluation

Introduction

Sun Ho Ryu is an inventor associated with Yongin, South Korea, and Samsung SDI Co., Ltd. His patent work addresses methods for evaluating the service life of secondary batteries.

Latest Patents

Ryu is associated with 1 patent: “Secondary Battery Life Evaluation Apparatus and Method.” The invention evaluates battery life by charging and discharging a secondary battery within defined normal deterioration ranges. It adjusts the accelerated charging current downward as the battery’s state of charge increases and reduces the accelerated discharging current as the state of charge decreases. These steps are repeated until the battery reaches a reference state of health. Evaluating accelerated battery life within normal deterioration ranges is intended to improve the reliability of the assessment.

Career Highlights

Ryu’s listed patent reflects work on battery testing and life evaluation, areas relevant to the development and assessment of secondary battery technology. He is associated with Samsung SDI Co., Ltd.

Collaborations

Hee Soo Yun and Jee Ae Shim are identified as Ryu’s coworkers. The available information does not specify their roles in the patent or the extent of their collaboration.

Conclusion

Sun Ho Ryu’s patent focuses on a controlled approach to accelerated secondary battery life evaluation, with the goal of producing reliable assessments while keeping charge and discharge conditions within normal deterioration ranges.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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