Saitama, Japan

Sumitaka Fujita

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Phc Holdings Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sumitaka Fujita. Retrieved from https://idiyas.com/inventor/sumitaka-fujita

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0


Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Sumitaka Fujita: Inventor in Cell Culture Measurement

Introduction

Sumitaka Fujita is an inventor associated with Saitama, Japan, and PHC Holdings Corporation. His patent work includes technology for measuring and analyzing samples in cell culture media.

Latest Patents

Fujita is associated with 1 patent: “Sample Measurement Device, Sample Measurement Method, and Sample Measurement Program.” The invention describes a cell culture analysis device that applies voltage to a sensor immersed in culture medium and measures the resulting current. Its analysis unit uses the measurement results to calculate the concentration of glucose or other substances in the medium. The device also measures the counter electrode’s terminal voltage while voltage is being applied, using that reading to detect measurement errors.

Career Highlights

Fujita’s patent reflects work on measurement and analysis systems for cell culture, including methods intended to assess culture-medium composition and identify errors during measurement. He is associated with PHC Holdings Corporation.

Collaborations

Fujita’s listed coworkers include Seiitirou Iketani and Satoshi Fukumoto.

Conclusion

Sumitaka Fujita’s patent work focuses on sensor-based analysis of cell culture media, combining concentration measurement with a method for detecting measurement errors.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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