Sejong, South Korea

Sukwhan Ko

This inventor holds 1 USPTO granted patent. Top assignee: Korea Institute of Energy Research. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sukwhan Ko. Retrieved from https://idiyas.com/inventor/sukwhan-ko

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Sukwhan Ko and Photovoltaic System Fault Diagnosis

Introduction

Sukwhan Ko is an inventor based in Sejong, South Korea. His work includes technology for diagnosing faults in photovoltaic systems, and he is associated with the Korea Institute of Energy Research.

Latest Patents

Ko is credited with 1 patent: “Photovoltaic System Having Fault Diagnosis Apparatus, and Fault Diagnosis Method for Photovoltaic System.” The invention uses temperature sensors to measure the junction box’s internal temperature and the solar module’s surface temperature, alongside a voltage sensor in the junction box. An operation unit compares these measurements to identify whether a fault is in the solar module, inside the junction box, or in the inverter. The approach is designed to keep initial investment costs low and detect solar module faults that may be difficult to spot by visual inspection.

Career Highlights

Ko’s patent work addresses practical monitoring and maintenance challenges in solar energy systems. The disclosed diagnostic method combines temperature and voltage measurements to help locate faults within photovoltaic equipment.

Collaborations

Ko’s listed coworkers include Gi-hwan Kang and Hee-eun Song. His association with the Korea Institute of Energy Research places his work within an organization focused on energy research.

Conclusion

Sukwhan Ko’s photovoltaic fault-diagnosis invention offers a sensor-based approach to identifying system faults while aiming to reduce costs and improve detection.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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