Hong Kong, China

Suk Ling Li


Average Co-Inventor Count = 2.7

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2022-2024

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2 patents (USPTO):Explore Patents

Title: Suk Ling Li: Innovator in 3D Scanning Technologies

Introduction

Suk Ling Li is a prominent inventor based in Hong Kong, known for her contributions to the field of 3D scanning technologies. With a total of two patents to her name, she has made significant advancements in methods for global registration and plane identification in 3D scenes. Her work is particularly relevant in applications related to building construction and object recognition.

Latest Patents

Suk Ling Li's latest patents include a "Method and system for global registration between 3D scans" and a "Method and apparatus for identifying planes of objects in 3D scenes." The first patent provides a comprehensive approach to aligning two point clouds obtained from a scanning device. This method involves extracting discriminative line-pairs and identifying matching groups to compute a global transformation matrix, ensuring accurate registration of 3D data. The second patent focuses on identifying planes within a 3D object by segmenting point clouds into categories and generating reference planes for further applications.

Career Highlights

Suk Ling Li is currently employed at the Hong Kong Applied Science and Technology Research Institute Company, Limited. Her role involves developing innovative solutions that enhance the accuracy and efficiency of 3D scanning technologies. Her expertise in this area has positioned her as a key figure in advancing research and applications in the field.

Collaborations

Suk Ling Li collaborates with notable colleagues, including Xueyan Tang and Chongshan Liu. These partnerships foster a dynamic environment for innovation and contribute to the development of cutting-edge technologies in 3D scanning.

Conclusion

Suk Ling Li's contributions to 3D scanning technologies exemplify her commitment to innovation and excellence. Her patents reflect a deep understanding of complex technical challenges and provide solutions that enhance the capabilities of 3D scanning applications.

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