Cheonan, South Korea

Suk-Lae Kim

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Suk-Lae Kim. Retrieved from https://idiyas.com/inventor/suk-lae-kim-tnl30dhz

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Suk-Lae Kim: Inventor in Cheonan, South Korea.

Introduction

Suk-Lae Kim is an inventor based in Cheonan, South Korea, associated with Samsung Electronics Co., Ltd. His listed patent concerns testing objects and handling items identified as abnormal during the testing process.

Latest Patents

The available information lists one patent for Kim: Method of Testing an Object and Apparatus for Performing the Same. The invention describes loading objects into a testing unit, checking whether they are normal or abnormal, and unloading them. If an object is found to be abnormal, the method directly reverses its path from the unloading unit back into the testing unit for another test. Kim is credited with 1 patent in the information provided.

Career Highlights

Kim’s listed invention addresses the testing and re-testing of objects within an apparatus. The available details associate his work with Samsung Electronics Co., Ltd., but do not provide further information about his role or career history.

Collaborations

In-Sik Kim and Jae-Ho Park are identified as Kim’s coworkers. The provided information does not specify their roles in the patent or the invention.

Conclusion

Suk-Lae Kim’s listed patent focuses on a testing apparatus that returns abnormal objects for re-testing, reflecting an approach to handling test results within a production or inspection process.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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