Seoul, South Korea

Suk Jun Kim

This inventor holds 2 USPTO granted patents and 3 published patent applications. Top assignee: Lunit Inc.. Active years: 2024-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Suk Jun Kim. Retrieved from https://idiyas.com/inventor/suk-jun-kim-fo2u53vw

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 2 

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2024-2026

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2 patents (USPTO):Explore Patents

Title: Suk Jun Kim: Innovator in Pathological Image Quality Evaluation

Introduction

Suk Jun Kim is a prominent inventor based in Seoul, South Korea. He has made significant contributions to the field of medical imaging, particularly in the evaluation of pathological slide images. With a total of 2 patents, his work is paving the way for advancements in diagnostic technology.

Latest Patents

Suk Jun Kim's latest patents focus on a method and device for evaluating the quality of pathological slide images. The computing device he developed includes at least one memory and at least one processor. This device is configured to analyze at least one object expressed in a pathological slide image, evaluate the quality of the image based on the analysis results, and perform additional operations according to the evaluation outcomes.

Career Highlights

Suk Jun Kim is currently associated with Lunit Inc., a company known for its innovative solutions in medical imaging and artificial intelligence. His work at Lunit Inc. emphasizes the importance of quality evaluation in pathological imaging, which is crucial for accurate diagnoses.

Collaborations

Some of Suk Jun Kim's notable coworkers include Chan Young Ock and Sang Hoon Song. Their collaborative efforts contribute to the ongoing advancements in the field of medical technology.

Conclusion

Suk Jun Kim's innovative work in evaluating the quality of pathological slide images showcases his commitment to improving medical diagnostics. His contributions are essential for enhancing the accuracy and reliability of pathological evaluations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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