Noida, India

Sudip Jain

This inventor holds 1 USPTO granted patent. Top assignee: Nxp B.v.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sudip Jain. Retrieved from https://idiyas.com/inventor/sudip-jain

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2025

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Sudip Jain - Innovator in Fault Testing Systems

Introduction

Sudip Jain is a notable inventor based in Noida, India. He has made significant contributions to the field of fault testing systems, showcasing his innovative spirit through his patented work. His expertise lies in developing methods that enhance the reliability of bus transactions in network circuits.

Latest Patents

Sudip Jain holds a patent for a "Method and system to delay a response associated with a bus transaction that is transmitted to a bus master to perform fault testing." This invention involves a bus response modifier that receives a bus response transmitted by a bus slave. The modifier selects a delay time to postpone the bus response, allowing for effective fault testing of the system. A determination is made whether the fault test fails based on the delayed bus response. This innovative approach is crucial for improving the reliability of network communications.

Career Highlights

Sudip Jain is currently employed at NXP B.V., where he continues to work on cutting-edge technologies. His role involves collaborating with other talented professionals in the field, contributing to advancements in electronic systems and fault testing methodologies.

Collaborations

Some of his coworkers include Mukesh Bansal and Prabhjot Singh. Their collective efforts contribute to the innovative environment at NXP B.V., fostering creativity and technological advancements.

Conclusion

Sudip Jain's contributions to fault testing systems exemplify the importance of innovation in technology. His patent reflects a commitment to enhancing the reliability of network circuits, making a significant impact in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…