San Marcos, CA, United States of America

Sudarshan Gopalakrishnan

This inventor holds 1 USPTO granted patent. Top assignee: Teradata US, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sudarshan Gopalakrishnan. Retrieved from https://idiyas.com/inventor/sudarshan-gopalakrishnan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Sudarshan Gopalakrishnan and CloudLake Performance Monitoring

Introduction

Sudarshan Gopalakrishnan is an inventor based in San Marcos, California. His patent work concerns monitoring data warehouse performance across primary and compute clusters.

Latest Patents

The supplied information lists one patent associated with Gopalakrishnan: “CloudLake Real-Time Single Operational View Query and Resource Monitoring.” The invention describes a system in which a data warehouse receives a performance-monitoring query from a client. A single operational view performance-monitoring API converts the query into a call to a federator API, which gathers monitoring information from fast-path APIs running on the primary and compute clusters. The federator compiles the requested information and returns it so the system can prepare a result set for the client. The record identifies 1 patent.

Career Highlights

Gopalakrishnan is associated with Teradata US, Inc. The patent reflects work on providing clients with a consolidated view of data warehouse performance and resource information across distributed computing processes.

Collaborations

Vimalraj Panneerselvam is identified as Gopalakrishnan’s coworker. The supplied information does not specify the nature of their collaboration on the patent.

Conclusion

Sudarshan Gopalakrishnan’s listed patent focuses on consolidating performance-monitoring data across data warehouse clusters to provide clients with a single operational view.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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