Suchi Prabhu Tandel

Title: Suchi Prabhu Tandel: Innovator in Testing Circuits

Introduction

Suchi Prabhu Tandel is a notable inventor based in Daman, India. She has made significant contributions to the field of testing circuits, particularly with her innovative patent. Her work exemplifies the intersection of technology and creativity, showcasing her dedication to advancing electronic testing methodologies.

Latest Patents

Suchi holds a patent for a "Generic width independent parallel checker for a device under test." This invention discloses a test circuit designed for testing a device under test (DUT). The circuit receives a test pattern output by the DUT and utilizes a content addressable memory (CAM) to store expected test data at various address locations. The CAM receives the test pattern and outputs an address containing the expected test data that matches the received pattern. Additionally, a memory component stores the expected test data at corresponding address locations. A control circuit facilitates the output of expected test data, while comparison circuitry generates an error count based on bit mismatches between the received test pattern and the expected data. This innovative approach enhances the accuracy and efficiency of testing devices.

Career Highlights

Suchi Prabhu Tandel is currently employed at STMicroelectronics International N.V., where she continues to develop her expertise in electronic testing. Her role at the company allows her to collaborate with other talented professionals in the field.

Collaborations

Some of her coworkers include Tejinder Kumar and Rakesh Malik, who contribute to a dynamic work environment that fosters innovation and teamwork.

Conclusion

Suchi Prabhu Tandel's contributions to the field of testing circuits through her patent demonstrate her innovative spirit and commitment to technological advancement. Her work not only enhances the efficiency of testing devices but also sets a benchmark for future innovations in the industry.