Cheonan, South Korea

Subeom Jeon

This inventor holds 2 USPTO granted patents. Top assignees: Semes Co., Ltd., Semes Co., Ltd.. Active years: 2020-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Subeom Jeon. Retrieved from https://idiyas.com/inventor/subeom-jeon

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2020-2026

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2 patents (USPTO):Explore Patents

Title: Subeom Jeon: Innovator in Liquid Chemical Inspection

Introduction

Subeom Jeon is a notable inventor based in Cheonan, South Korea. He has made significant contributions to the field of liquid chemical inspection, particularly through his innovative methods that enhance the accuracy and efficiency of the inspection process.

Latest Patents

Subeom Jeon holds a patent for a "Method of inspecting liquid chemicals." This method involves irradiating at least two laser beams onto liquid chemicals discharged from an ink jet head. By detecting the interference pattern generated from laser scattering, the conditions of the liquid chemicals can be accurately identified. This innovative approach has the potential to improve quality control in various applications.

Career Highlights

Subeom Jeon is currently employed at Semes Co., Ltd., where he continues to develop and refine his inventions. His work at the company has positioned him as a key player in advancing technologies related to liquid chemical inspection.

Collaborations

He collaborates with talented coworkers, including Sukwon Jang and Sang Hwan Park, who contribute to the innovative environment at Semes Co., Ltd. Their combined expertise fosters a culture of creativity and technological advancement.

Conclusion

Subeom Jeon's contributions to the field of liquid chemical inspection exemplify the impact of innovative thinking in technology. His patent and ongoing work at Semes Co., Ltd. highlight the importance of advancements in this area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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