Oravske Vesele, Slovakia

Stopjakova Viera

This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Stopjakova Viera. Retrieved from https://idiyas.com/inventor/stopjakova-viera-donbnpqx

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 14(Granted Patents)


Company Filing History:

goldMedal1 out of 834,659 
Other
 patents

Years Active: 2002

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1 patent (USPTO):Explore Patents

Title: Stopjakova Viera: Innovator in Electronic Device Testing

Introduction

Stopjakova Viera is a notable inventor based in Oravske Vesele, Slovakia. He has made significant contributions to the field of electronic device testing, particularly through his innovative methods and apparatuses. His work focuses on enhancing the efficiency and reliability of testing electronic devices.

Latest Patents

Viera holds a patent for a "Method and apparatus for testing electronic devices." This invention presents test circuitry and methods that perform supply current measurement. The test circuitry can be implemented on-chip and is designed to handle transient supply currents. Importantly, the methods developed do not cause additional power supply voltage degradation. Furthermore, they provide detection capabilities for open defects, which significantly reduces the transient supply current.

Career Highlights

Throughout his career, Viera has demonstrated a commitment to advancing technology in electronic testing. His innovative approach has led to the development of effective testing methodologies that are crucial for ensuring the performance and reliability of electronic devices.

Collaborations

Viera has worked alongside Hans Manhaeve, contributing to the advancement of their shared goals in the field of electronic device testing.

Conclusion

Stopjakova Viera's contributions to electronic device testing through his patented methods highlight his role as an innovator in the industry. His work continues to influence the way electronic devices are tested and evaluated for performance.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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