Balegem, Belgium

Stijn Dhondt

This inventor holds 1 USPTO granted patent, plus 1 CIPO patent. Top assignees: University of Ghent, Vib Vzw. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Stijn Dhondt. Retrieved from https://idiyas.com/inventor/stijn-dhondt

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: Stijn Dhondt: Innovator in Plant Growth Technology

Introduction

Stijn Dhondt is a notable inventor based in Balegem, Belgium. He has made significant contributions to the field of plant growth technology, particularly through his innovative patent. His work focuses on enhancing the methods used for growing and screening plant samples.

Latest Patents

Stijn Dhondt holds a patent for the Netwell assay plate system. This invention relates to a device and a method for growing and screening plant samples. It comprises a specialized multiwell plate system that is well-suited for housing granular media. This system is designed for use in in vivo screening methods of uninterrupted plant tissue growth.

Career Highlights

Throughout his career, Stijn has worked with various organizations, including Vib Vzw and Universiteit Gent. His experience in these institutions has allowed him to develop and refine his innovative ideas in plant growth technology.

Collaborations

Stijn has collaborated with notable individuals in his field, including Dirk Gustaaf Inzé. These collaborations have contributed to the advancement of his research and inventions.

Conclusion

Stijn Dhondt is a pioneering inventor whose work in plant growth technology has the potential to impact agricultural practices significantly. His innovative patent and collaborations highlight his commitment to advancing this important field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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