Oslo, Norway

Stig Stoa

This inventor holds 2 USPTO granted patents. Top assignee: Equanostic as. Active years: 2025-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Stig Stoa. Retrieved from https://idiyas.com/inventor/stig-stoa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.4

ph-index = 1


Company Filing History:


Years Active: 2025-2026

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2 patents (USPTO):Explore Patents

Title: Stig Stoa: Innovator in Surface Inspection Technology

Introduction

Stig Stoa is a notable inventor based in Oslo, Norway. He has made significant contributions to the field of surface inspection technology. His innovative approach has led to the development of a unique patent that enhances the efficiency and accuracy of surface inspections.

Latest Patents

Stig Stoa holds a patent for a "Hybrid sensor head for surface inspection and method of use." This invention features a hybrid sensor head designed for inspecting surfaces. The device includes a casing that supports at least one pair of pulse transceivers. These transceivers emit pulses through a medium at different propagation speeds toward the surface and receive reflected pulses. The configuration allows for precise measurements, enabling the computation of range and velocity for each transceiver.

Career Highlights

Stig Stoa is associated with Equanostic AS, where he applies his expertise in developing advanced inspection technologies. His work has been instrumental in pushing the boundaries of what is possible in surface inspection.

Collaborations

Stig collaborates with talented individuals such as Andreas Reason Dahl and Øyvind Lunde Hodneland. Their combined efforts contribute to the innovative projects at Equanostic AS.

Conclusion

Stig Stoa's contributions to surface inspection technology exemplify the impact of innovation in engineering. His patent and collaborative efforts continue to shape the future of this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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