Stewart McKechnie

Title: Stewart McKechnie: Innovator in Raman Spectroscopy

Introduction

Stewart McKechnie is a notable inventor based in Albuquerque, NM (US). He has made significant contributions to the field of spectroscopy, particularly through his innovative patent in Raman spectrometry. His work has implications for on-the-move contaminant analysis, showcasing the intersection of technology and environmental safety.

Latest Patents

Stewart McKechnie's most recent patent is titled "Dual pulse single event Raman spectroscopy." This invention involves systems and methods for performing Raman spectrometry, wherein a Raman spectroscopy system is mounted on a vehicle for real-time contaminant analysis. The system is designed to interrogate a target with a laser at a predetermined pulse repetition frequency (PRF). During each PRF cycle, the laser is dual pulsed at a first wavelength and a second wavelength. Raman spectra are collected and utilized to identify the target by matching a Raman signature with the collected Raman spectra. This innovative approach enhances the efficiency and accuracy of contaminant detection.

Career Highlights

Throughout his career, Stewart has worked with several prominent companies, including Itt Manufacturing Enterprises, Inc. and Peraton Inc. His experience in these organizations has allowed him to refine his skills and contribute to various projects in the field of spectroscopy and beyond.

Collaborations

Stewart has collaborated with notable professionals in his field, including Wayne Armstrong and Robert Battis. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Stewart McKechnie's contributions to Raman spectroscopy exemplify the impact of innovative thinking in technology. His patent and career achievements highlight the importance of advancements in contaminant analysis, paving the way for future developments in the field.